The advanced course covers a wide range of topics including systematic errors, factors affecting intensities of diffraction peaks; data reduction algorithms; phase identification; advanced data mining with the PDF and its application in search/match; powder pattern indexing methods; structure solution methods; quantitative phase analysis using both reference intensity ration (RIR) and Rietveld Method.
ICDD - Advanced Methods of X-ray Powder Diffraction - XRD II
8 June 2020 08:30 - 12 June 2020 12:00, Newtown Square, PA, United States
Introduction
Speakers
-
Tom Blanton United States
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International Centre for Diffraction Data
International Centre for Diffraction Data, 12 Campus Blvd., Newtown Square, PA, 19073, United States
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