The advanced course covers a wide range of topics including systematic errors, factors affecting intensities of diffraction peaks; data reduction algorithms; phase identification; advanced data mining with the PDF and its application in search/match; powder pattern indexing methods; structure solution methods; quantitative phase analysis using both reference intensity ration (RIR) and Rietveld Method.
ICDD - Advanced Methods of X-ray Powder Diffraction - XRD II
8 June 2020 08:30 - 12 June 2020 12:00, Newtown Square, PA, United States
Introduction
Speakers
Sponsorship & supporting organisations
Sponsors
Venue
International Centre for Diffraction Data
International Centre for Diffraction Data, 12 Campus Blvd., Newtown Square, PA, 19073, United States
Useful links
Organised by
Contact information
Related events
TAC 2025 - 60th Anniversary Conference
14 April 2025 09:00 - 16 April 2025 17:00, Guildford, United Kingdom
Future Labs Live Basel
27 May 2025 09:00 - 28 May 2025 17:00, Basel, Switzerland
The 61st Annual Convention of Chemists and the International Conference on Emerging Trends in Chemistry to Revolutionize Indian Chemical Industries for Viksit Bharat@2047
19 December 2024 10:00 - 21 December 2024 17:00, Jaipur, India
Joint SoBRA / 澳门六合彩开奖记录 Winter Conference 2024 Current Issues in Contaminated Land Risk Assessment
10 December 2024 09:45-18:00, London, United Kingdom
Search
Advertisement
Spotlight
Explore
Membership
